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Evolution of metrology techniques for high intensity ultrasound
Abstract   Peer reviewed

Evolution of metrology techniques for high intensity ultrasound

Mark E. Schafer
The Journal of the Acoustical Society of America, v 129(4), pp 2403-2403
Apr 2011
DOI: https://doi.org/10.1121/1.3587824

Abstract

High intensity ultrasound device characterization presents a number of formidable measurement challenges. Whether the system is based on a high pressure, short temporal (i.e., shock wave), or a medium pressure, long temporal (i.e., HIFU) approach, the critical issue has been the destructive effects on the measurement sensor. Some shock wave systems have the additional issue of high shock to shock variability. This presentation reviews the evolution of the measurement and regulatory approaches used for characterizing high intensity devices. Every approach involves a compromise between the desire for a complete characterization of all possible parameters and the practical realities of making the measurements. Early work was done with very rugged sensors which provided nearly worthless data. The need for improved temporal and spatial resolution drove the development of a number of novel approaches including piezoelectric, force balance, and optical systems. Customized equipment has been developed for each particular type of HIU device. In some cases, measurements at low settings are used to predict results at higher settings. Improvements in measurement technology have often resulted in improved equipment designs, leading to better treatment efficacy and patient safety. However, there is still a gap between initial system characterization and day‐to‐day quality assurance needs.

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