Book chapter
Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations
Electron Backscatter Diffraction in Materials Science, pp 177-188
30 Apr 2009
Abstract
In this chapter we are concerned with second-order interrelations between structure, properties, and processes of materials. Structure can be described in many different ways. The most common metrics of structure involve “first-order” (volume fraction) information: for example, the orientation distribution function. Such metrics serve well as the basis for property relations that do not depend significantly upon the geometrical placement of the material constituents. However, many properties (such as those relating to failure) depend critically upon the geometrical distribution of particular material components, and hence benefit enormously from knowledge of the “higher order” structure.
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6 citations in Scopus
Details
- Title
- Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations
- Creators
- David T. Fullwood - Brigham Young UniversitySurya R. Kalidindi - Drexel UniversityBrent L. Adams - Brigham Young University
- Contributors
- Adam J. Schwartz (Editor)Mukul Kumar (Editor)Brent L. Adams (Editor) - Brigham Young UniversityDavid P. Field (Editor)
- Publication Details
- Electron Backscatter Diffraction in Materials Science, pp 177-188
- Publisher
- Springer US; Boston, MA
- Number of pages
- 12
- Resource Type
- Book chapter
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Scopus ID
- 2-s2.0-84892254502
- Other Identifier
- 991021901312704721