Book chapter
X-Ray Scattering-Based Methods
Materials Characterization Methods for Epitaxial Films and Heterostructures, 21
01 Jan 2025
Abstract
The following sections are included:
Introduction
X-Ray Diffraction
X-Ray Reflectivity
Synchrotron-Enabled Approaches
Summary and Outlook
Acknowledgments
Appendix A
References
Metrics
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Details
- Title
- X-Ray Scattering-Based Methods
- Creators
- Steven J. May - Drexel University, Materials Science and Engineering
- Contributors
- Scott A. Chambers (Editor) - Pacific Northwest National Laboratory
- Publication Details
- Materials Characterization Methods for Epitaxial Films and Heterostructures, 21
- Series
- Handbook of Molecular Beam Epitaxy of Oxide Materials; 2
- Edition
- 1st
- Number of pages
- 82
- Resource Type
- Book chapter
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Scopus ID
- 2-s2.0-105034222212
- Other Identifier
- 991022180003404721