Neuromorphic computing with non-volatile memory (NVM) can significantly improve performance and lower energy consumption of machine learning tasks implemented using spike-based computations and bio-inspired learning algorithms. High voltages required to operate certain NVMs such as phase-change memory (PCM) can accelerate aging in a neuron's CMOS circuit, thereby reducing the lifetime of neuromorphic hardware. In this work, we evaluate the long-term, i.e., lifetime reliability impact of executing state-of-the-art machine learning tasks on a neuromorphic hardware, considering failure models such as negative bias temperature instability (NBTI) and time-dependent dielectric breakdown (TDDB). Based on such formulation, we show the reliability-performance trade-off obtained due to periodic relaxation of neuromorphic circuits, i.e., a stop-and-go style of neuromorphic computing.
A Case for Lifetime Reliability-Aware Neuromorphic Computing
Creators
Shihao Song - Drexel University
Anup Das - Drexel University
IEEE
Publication Details
2020 IEEE 63RD INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), v 2020-, pp 596-598
Series
Midwest Symposium on Circuits and Systems Conference Proceedings
Publisher
IEEE
Number of pages
3
Grant note
CCF-1942697 / National Science Foundation Faculty Early Career Development Award (CAREER: Facilitating Dependable Neuromorphic Computing: Vision,Architecture, and Impact on Programmability)
Resource Type
Conference proceeding
Language
English
Academic Unit
Electrical and Computer Engineering
Web of Science ID
WOS:000776673800146
Scopus ID
2-s2.0-85090550459
Other Identifier
991019295298304721
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