Conference proceeding
A novel method for defect location using IDDQ: VOL 1: COMMUNICATION THEORY AND SYSTEMS
2004 INTERNATIONAL CONFERENCE ON COMMUNICATION, CIRCUITS, AND SYSTEMS, VOLS 1 AND 2, pp 1325-1328
01 Jan 2004
Abstract
A novel algorithm for fault location using IDDQ has been presented in this paper. A significant advantage of this method is that it could effectively locate multiple defects in a circuit. Experiment used to illuminate this algorithm is discussed in details.
Metrics
8 Record Views
Details
- Title
- A novel method for defect location using IDDQ
- Creators
- B R XuH B Xu - University of Electronic Science and Technology of ChinaY DengH J Wang - University of Electronic Science and Technology of China
- Publication Details
- 2004 INTERNATIONAL CONFERENCE ON COMMUNICATION, CIRCUITS, AND SYSTEMS, VOLS 1 AND 2, pp 1325-1328
- Publisher
- IEEE
- Number of pages
- 4
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- College of Computing and Informatics
- Web of Science ID
- WOS:000224820400290
- Other Identifier
- 991021868108804721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Computer Science, Hardware & Architecture
- Computer Science, Information Systems
- Computer Science, Software Engineering
- Engineering, Electrical & Electronic
- Telecommunications