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A study on the negative photoresponse of AlGaAs/GaAs MODFETs
Conference proceeding

A study on the negative photoresponse of AlGaAs/GaAs MODFETs

M.A Romero, P.R Herczfeld and IEEE
1993 IEEE MTT-S International Microwave Symposium Digest, v 3, pp 1403-1406 vol.3
1993

Abstract

Electron optics Electron traps Epitaxial layers Gallium arsenide HEMTs Lighting MODFETs Optical buffering Optical modulation Voltage
A model for the mechanism of negative photoresponse, i.e. the decrease of drain current under illumination, in AlGaAs/GaAs MODFETs (modulation-doped field--effect transistors) is presented. A comprehensive experimental study examining the dependence of this phenomena on gate-to-source bias voltage and optical power is also reported. The negative photoresponse is attributed to trapping of photogenerated carriers in the GaAs buffer layer, causing a change in the potential profile and a consequent reduction in the number of carriers in the 2-DEG (two-dimensional electron gas) channel.< >

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Engineering, Electrical & Electronic
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