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Analytical description of electric field profile in heterojunctions
Conference proceeding

Analytical description of electric field profile in heterojunctions

F Castro and B Nabet
1999 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, Proceedings, Vols 1 & 2, v 2, pp 545-547
1999

Abstract

Absorption Analytical models Charge carrier density Electrons Epitaxial layers Gallium arsenide Heterojunctions Nonhomogeneous media Optical filters Photodetectors
We propose a model that describes the electric field profile as it extends into the GaAs layer of a modulation-doped AlGaAs-GaAs structure. This closed-form analytical expression is obtained from an accurate two-dimensional electron gas (2DEG) sheet density model and is particularly suitable for simulating the effects of absorption modulation on the spectral response of multilayer photodetectors. A significant improvement in model accuracy is achieved by introducing an exponential coefficient that provides a closer description of the electric field profile behavior near the heterointerface where field strengths are highest. Results are compared with device simulation programs.

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