BUILT-IN SELF-DIAGNOSTIC READ-ONLY-MEMORIES

Conference proceeding

P Nagvajara, M.G Karpovsky and IEEE

1991, Proceedings. International Test Conference, pp 695-703

1991

Additional Links

Automatic testing

Built-in self-test

Circuit faults

Circuit testing

Design engineering

Error correction

Error correction codes

Feedback

Polynomials

Read only memory

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Title: BUILT-IN SELF-DIAGNOSTIC READ-ONLY-MEMORIES
Creators: P Nagvajara
M.G Karpovsky
IEEE
Publication Details: 1991, Proceedings. International Test Conference, pp 695-703
Publisher: IEEE
Resource Type: Conference proceeding
Language: English
Academic Unit: Electrical and Computer Engineering
Web of Science ID: WOS:A1991BV25V00080
Other Identifier: 991019182663204721

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