Conference proceeding
Cepstrum technique for multilayer structure characterization
IEEE Symposium on Ultrasonics, v 3, pp 1571-1574
1990
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
The triple cepstrum, the third power of the inverse Fourier transform (IFT) of the logarithm of signal power spectrum, is used to characterize two-layer structures. The thickness of each layer can be found from the positions of the peaks in the triple cepstrum. Simulations and preliminary experiments have shown that the relative reflection coefficients can be reconstructed, in the ideal and lossless case, from the polarity and the amplitude of these peaks, as predicted by theory. The impedance pattern can be predicted even at low signal to noise ratio. A potential application of this method is to characterize blood vessel walls. The resulting thickness and impedance pattern could be useful in detecting and classifying plaques, particularly in the early stages.< >
Metrics
9 Record Views
Details
- Title
- Cepstrum technique for multilayer structure characterization
- Creators
- X.M Lu - Drexel UniversityJ.M Reid - Drexel UniversityK Soetanto - Drexel UniversityL Weng - Drexel UniversityV Genis - Drexel University
- Publication Details
- IEEE Symposium on Ultrasonics, v 3, pp 1571-1574
- Conference
- IEEE Symposium on Ultrasonics
- Publisher
- IEEE
- Number of pages
- 1
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- School of Biomedical Engineering, Science, and Health Systems; [Retired Faculty]
- Web of Science ID
- WOS:A1990BT34L00313
- Other Identifier
- 991019302291004721
UN Sustainable Development Goals (SDGs)
This publication has contributed to the advancement of the following goals:
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Engineering, Electrical & Electronic
- Microscopy
- Physics, Applied