Conference proceeding
Coset error detection in BIST design
Digest of Papers. 1992 IEEE VLSI Test Symposium, v 1992-, pp 79-83
1992
Abstract
A finite-field algebraic description of a built-in self-test (BIST) design based on primitive feedback shift registers (LFSRs) implementing the test generator and the signature analyzer (SA) is presented. That the BIST schemes that use the TG and the SA with the same feedback polynomial detect errors which distort the output functions of the circuits-under-test for a set of the input vectors forming a coset of a subspace. The authors term this type of error the 'single coset error'. Signature schemes which detect the coset errors of multiplicity r are further described, (r<n, where n is the number of inputs). It is also shown that a BIST scheme based on TG and SA with feedback polynomials reciprocal of one another will have a poor error detection capability.< >
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Details
- Title
- Coset error detection in BIST design
- Creators
- P Nagvajara - Drexel UniversityM.G Karpovsky
- Publication Details
- Digest of Papers. 1992 IEEE VLSI Test Symposium, v 1992-, pp 79-83
- Conference
- 1992 IEEE VLSI Test Symposium
- Publisher
- IEEE
- Number of pages
- 1
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Scopus ID
- 2-s2.0-85026920449
- Other Identifier
- 991019173537104721