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Deep Action Unit Classification using a Binned Intensity Loss and Semantic Context Model
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Deep Action Unit Classification using a Binned Intensity Loss and Semantic Context Model

Edward Kim and Shruthika Vangala
2016 23RD INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION (ICPR), pp.4136-4141
International Conference on Pattern Recognition
01 Jan 2016

Abstract

Computer Science Computer Science, Artificial Intelligence Science & Technology Technology

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