Enhanced Parametric Estimation Of Electroencephalograms Under Acceleration Stress

Conference proceeding

F Yarman-Vural, B Onaral and E Cetin

[1990] Proceedings of the Twelfth Annual International Conference of the IEEE Engineering in Medicine and Biology Society, (2), pp 837-839

1990

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Acceleration

Additive white noise

Biomedical monitoring

Brain modeling

Density measurement

Electroencephalography

Lab-on-a-chip

Noise measurement

Pollution measurement

Stress

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Title: Enhanced Parametric Estimation Of Electroencephalograms Under Acceleration Stress
Creators: F Yarman-Vural - Drexel University
B Onaral
E Cetin
Publication Details: [1990] Proceedings of the Twelfth Annual International Conference of the IEEE Engineering in Medicine and Biology Society, (2), pp 837-839
Publisher: IEEE
Resource Type: Conference proceeding
Language: English
Academic Unit: School of Biomedical Engineering, Science, and Health Systems
Other Identifier: 991019182761804721