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Extraction of Material Parameters from a Multilayer Multi-Harmonic Thickness Shear Mode (MTSM) Sensor Data using Genetic Algorithm
Conference proceeding

Extraction of Material Parameters from a Multilayer Multi-Harmonic Thickness Shear Mode (MTSM) Sensor Data using Genetic Algorithm

Ertan Ergezen, Matias Hochman, Johann Desa, Ryszard M. Lec and IEEE
2008 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, VOLS 1 AND 2, pp 538-543
01 Jan 2008

Abstract

Automation & Control Systems Engineering Engineering, Electrical & Electronic Science & Technology Technology

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Web of Science research areas
Automation & Control Systems
Engineering, Electrical & Electronic
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