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High resolution electron energy loss spectroscopy study of vapor-deposited polyaniline thin films
Conference proceeding

High resolution electron energy loss spectroscopy study of vapor-deposited polyaniline thin films

R. V. Plank, N. J. DiNardo and J. M. Vohs
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, v 15(3), pp 538-543
May 1997

Abstract

polymers
Vapor deposited polyaniline films on Cu(110) have been characterized using high resolution electron energy loss spectroscopy. Ultrathin films (⩽100 Å) were found to exist in an oxidation state close to that of the starting emeraldine powder. After doping with HCl, the films exhibited plasmon excitations in the far-ir, suggesting that they are highly crystalline and possess electrical conductivities higher than those of HCl doped emeraldine films produced by wet-chemical deposition techniques. In contrast, thicker vapor-deposited films (⩾1000 Å) were found to be highly reduced, less crystalline, and exhibited electrical conductivities lower than those of the thinner films upon doping. These results suggest that the interactions of emeraldine with a metal surface can play an important role in determining the chemical, structural, and electronic properties of polyaniline films near the polymer-substrate interface.

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Collaboration types
Domestic collaboration
Web of Science research areas
Materials Science, Coatings & Films
Physics, Applied
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