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Importance of Multi-parameter SAT Attack Exploration for Integrated Circuit Security
Conference proceeding

Importance of Multi-parameter SAT Attack Exploration for Integrated Circuit Security

Kyle Juretus, Ioannis Savidis and IEEE
2018 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2018), pp.366-369
01 Jan 2018

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology

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Engineering, Electrical & Electronic