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Magnetic resonance studies on CdCr/sub 2-x/InSe/sub 4/ thin films
Conference proceeding

Magnetic resonance studies on CdCr/sub 2-x/InSe/sub 4/ thin films

Y.H Kim, S.M bhagal, M.A Manheimer, S Tyagi, L Maksymowicz and M Lubecka
1992. Digests of Intermag. International Magnetics Conference, pp 448-448
1992

Abstract

Absorption Glass Inorganic materials Magnetic films Magnetic materials Magnetic resonance Magnetic semiconductors Magnetization Physics Semiconductor materials
Recently, two of us have developed the technology for preparing homogeneous thin films of the spinel CdCr 2 Se 4 with varying amounts of In impurity. Ferromagnetic resonance (FMR) and spin wave resonance (SWR) measurements at 10 GHz at temperatures (T) varying between 4 and 300 K were used to elucidate the magnetic state -- ferromagnet (FM) re-entrant (REE) or spin glass (SG), of the material as a function of In content. However, it is realized that a thorough understanding is not possible without making resonance measurements at several frequencies. For instance, it is impossible to delineate various contributions to the peak-to-peak linewidth (Γ PP ) without knowing its frequency dependence. The present report is based on magnetic resonance data on thin films of CdCr 2-x In x Se 4 at several frequencies between 3 and 36 GHz and at 77 < T < 200 K. We will also report on the remarkable sensitivity of the resonance parameters to exposure, of the sample, to modest (-1 mW) amounts of light from a tungsten lamp over a period of a few seconds.

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