Measurement of Minority Carrier Diffusion Lengths in Semiconductor Nanowires

Conference proceeding

Open access

Jonathan E. Allen, Yi Gu, John P. Romankiewicz, Jessica L. Lensch, Steven J. May, Teri W. Odom, Bruce W. Wessels and Lincoln J. Lauhon

2006 64th Device Research Conference, pp 289-290

Jun 2006

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https://doi.org/10.1109/DRC.2006.305186View

Published, Version of Record (VoR) Open

Chemical technology

Electric variables measurement

Length measurement

Materials science and technology

Nanowires

Optical microscopy

Photoconductivity

Schottky barriers

Space charge

Wire

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Title: Measurement of Minority Carrier Diffusion Lengths in Semiconductor Nanowires
Creators: Jonathan E. Allen - Northwestern University
Yi Gu - Northwestern University
John P. Romankiewicz - Northwestern University
Jessica L. Lensch - Northwestern University
Steven J. May - Northwestern University
Teri W. Odom - Northwestern University
Bruce W. Wessels - Northwestern University
Lincoln J. Lauhon - Northwestern University
Publication Details: 2006 64th Device Research Conference, pp 289-290
Publisher: IEEE
Number of pages: 2
Resource Type: Conference proceeding
Language: English
Academic Unit: Materials Science and Engineering
Other Identifier: 991021934113604721