Conference proceeding
Nonparametric flaw detection in large grained materials
IEEE Symposium on Ultrasonics, v 2, pp 1137-1141
1990
Abstract
The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.< >
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Details
- Title
- Nonparametric flaw detection in large grained materials
- Creators
- N.M Bilgutay - Drexel UniversityK.D Donohue - Drexel UniversityX Li - Drexel University
- Publication Details
- IEEE Symposium on Ultrasonics, v 2, pp 1137-1141
- Conference
- IEEE Symposium on Ultrasonics
- Publisher
- IEEE
- Number of pages
- 1
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:A1990BT34L00221
- Other Identifier
- 991019182647204721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Engineering, Electrical & Electronic
- Microscopy
- Physics, Applied