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Optimal Metric Distortion for Matching on the Line
Conference proceeding   Peer reviewed

Optimal Metric Distortion for Matching on the Line

Aris Filos-Ratsikas, Vasilis Gkatzelis, Mohamad Latifian, Emma Rewinski and Alexandros A. Voudouris
IJCAI (United States), pp 3857-3865
2025

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