Conference proceeding
Process Variation Sensitivity of the Rotary Traveling Wave Oscillator
2011 12TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), pp.242-248
International Symposium on Quality Electronic Design
01 Jan 2011
Abstract
Rotary clocking is a low-power technology for multi-GHz clock generation and distribution. In this paper, a sensitivity analysis of the Rotary Traveling Wave Oscillator (RTWO) to process variations is presented based on a 90 nm technology. The analysis is focused on the effects of 1) multiple process corners, 2) power supply fluctuation, 3) chip temperature change, 4) the variations of the RTWO transmission line width and separation, on the operating frequency and power consumption of the RTWO. The individual analysis of these factors is presented as well as a Monte-Carlo based analysis to analyze the comprehensive effects of the process parameter variations and process corners. SPICE simulation results show that the RTWO exhibits a natural robustness to resist these on-chip variations.
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Details
- Title
- Process Variation Sensitivity of the Rotary Traveling Wave Oscillator
- Creators
- Ying Teng - Drexel Univ, Dept Elect & Comp Engn, Philadelphia, PA 19104 USABaris Taskin - Drexel UniversityIEEE
- Publication Details
- 2011 12TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), pp.242-248
- Series
- International Symposium on Quality Electronic Design
- Publisher
- IEEE
- Number of pages
- 7
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Identifiers
- 991019170389704721
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