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Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films
Conference proceeding

Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films

T W Mercer, D L Carroll, Y Liang, D Bonnell, T A Friedmann, M P Siegal and N J Dinardo
ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2, pp.53-58
01 Jan 1997

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Microscopy Science & Technology Technology

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Microscopy