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Slotted vias for dual damascene interconnects in 1 Gb DRAMs
Conference proceeding

Slotted vias for dual damascene interconnects in 1 Gb DRAMs

R.F Schnabel, G Bronner, L Clevenger, D Dobuzinsky, G Costrini, R Filippi, J Gambino, M Hug, R Iggulden, C Lin, …
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325), pp 43-44
1999

Abstract

Artificial intelligence Capacitance Delay Integrated circuit interconnections LAN interconnection Metallization Microelectronics Random access memory SDRAM Wiring
A novel interconnect scheme is presented which has been used to significantly reduce the chip size of an 1 Gb SDRAM chip. The key element is the use of slotted vias for low resistance horizontal interconnects. This allows us to combine low capacitance/high resistance lines with low resistance/high capacitance lines. The slotted vias are realized by a dual damascene integration scheme without adding an additional mask level or process cost, with excellent continuity yield and good electromigration performance.

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