Conference proceeding
Stability of Rotary Traveling Wave Oscillators under Process Variations and NBTI
2017 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), pp.730-733
IEEE International Symposium on Circuits and Systems
01 Jan 2017
Abstract
Resonant rotary clocking is a low-power clocking technology for multi-phase clock generation in GHz frequency range. In this paper, Rotary TravelingWave Oscillators (RTWOs) are analyzed under process variations and negative bias temperature instability (NBTI) at the 90nm technology node. The analysis is focused on 1) variations in the physical geometries of the rotary ring, 2) inter and intra-die transistor variations, 3) power supply fluctuation and 4) NBTI. Monte-Carlo based analysis are performed to study the effects of process variations and transistor aging on the operating frequency and power consumption of the rotary ring at a temperature of 110 degrees C. SPICE based simulations show natural robustness against process variations, and NBTI.
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Details
- Title
- Stability of Rotary Traveling Wave Oscillators under Process Variations and NBTI
- Creators
- Ragh Kuttappa - Drexel Univ, ECE Dept, Philadelphia, PA 19104 USALeo Filippini - Drexel Univ, ECE Dept, Philadelphia, PA 19104 USAScott Lerner - Drexel Univ, ECE Dept, Philadelphia, PA 19104 USABaris Taskin - Drexel UniversityIEEE
- Publication Details
- 2017 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), pp.730-733
- Series
- IEEE International Symposium on Circuits and Systems
- Publisher
- IEEE
- Number of pages
- 4
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Identifiers
- 991019170542804721
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