- Title
- Test strategies for SoC quality
- Creators
- P Nagvajara - Drexel UniversityC Ryan
- Publication Details
- Twelfth Annual IEEE International ASIC/SOC Conference (Cat. No.99TH8454), pp 221-222
- Conference
- Twelfth Annual IEEE International ASIC/SOC Conference, 12th
- Publisher
- IEEE
- Number of pages
- 1
- Resource Type
- Conference proceeding
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Other Identifier
- 991019182764704721
Conference proceeding
Test strategies for SoC quality
Twelfth Annual IEEE International ASIC/SOC Conference (Cat. No.99TH8454), pp 221-222
1999
Abstract
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