Time-constrained failure diagnosis in distributed embedded systems

Conference proceeding

Nagarajan Kandasamy, John P Hayes, Brian T Murray and IEEE COMPUTER SOCIETY

INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS, pp 449-458

2002

Additional Links

Applied sciences

Computer science; control theory; systems

Computer systems and distributed systems. User interface

Computer systems performance. Reliability

Electronics

Exact sciences and technology

Hardware

Reliability

Software

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4 citations in Scopus

Title: Time-constrained failure diagnosis in distributed embedded systems
Creators: Nagarajan Kandasamy - University of Michigan
John P Hayes - University of Michigan
Brian T Murray - Delphi Automotive Systems, Brighton, MI 48116, United States
IEEE COMPUTER SOCIETY
Publication Details: INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS, pp 449-458
Conference: DSN : dependable systems and networks (Washington, District of Columbia, United States, 23 Jun 2002–26 Jun 2002)
Publisher: IEEE
Resource Type: Conference proceeding
Language: English
Academic Unit: Electrical and Computer Engineering
Web of Science ID: WOS:000177134700047
Scopus ID: 2-s2.0-0036927273
Other Identifier: 991020546589704721

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Web of Science research areas: Computer Science, Information Systems; Computer Science, Software Engineering; Engineering, Electrical & Electronic