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USING SURFACE CHARACTERIZATION FOR ENGINEERING EDUCATION LABORATORIES
Conference proceeding

USING SURFACE CHARACTERIZATION FOR ENGINEERING EDUCATION LABORATORIES

Michael G. Mauk, Richard Y. Chiou, Shraman Kadapa, Yalcin Ertekin and Tzu-Liang (Bill) Tseng
PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, 2017, VOL 5, v 5
01 Jan 2018

Abstract

Education & Educational Research Education, Scientific Disciplines Engineering, Mechanical Science & Technology Engineering Social Sciences Technology
A suite of surface measurement methods are described, assessed and compared for several types of materials of technological interest including silicon for solar cells, machined metal surfaces, and rapid prototyped (e.g., 3d-printed) plastic parts. We describe student laboratory projects for surface "roughness characterization using different techniques including depth gauge, stylus profilometer, atomic force microscope (AFM), glossmeter, LED light scattering, laser light scattering, image processing, and wetting angle measurements. This provides instructive case studies for learning concepts of surface characterization and metrology, comparing information gained by different measurement techniques, gauge reproducibility and repeatability, optimizing post-processing in rapid prototyping, and issues for adapting measurements for automated and in-line quality assurance.

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Collaboration types
Domestic collaboration
Web of Science research areas
Education, Scientific Disciplines
Engineering, Mechanical
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