Vector form of wipe-out memory and its experimental testing

Conference proceeding

G FRIEDMAN, K CHA, Y HUANG and J KOUVEL

IEEE transactions on magnetics, v 36(5), pp 3185-3188

2000

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Magnetic properties and materials

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Physics

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Title: Vector form of wipe-out memory and its experimental testing
Creators: G FRIEDMAN - Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, United States
K CHA - Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, United States
Y HUANG - Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, United States
J KOUVEL - Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, United States
Publication Details: IEEE transactions on magnetics, v 36(5), pp 3185-3188
Conference: 2000 International Magnetics Conference (INTERMAG 2000) (Toronto, Ontario, Canada, 09 Apr 2000–12 Apr 2000)
Publisher: Institute of Electrical and Electronics Engineers; New York, NY
Grant note: IEEE
Resource Type: Conference proceeding
Language: English
Academic Unit: Electrical and Computer Engineering
Web of Science ID: WOS:000167371700326
Scopus ID: 2-s2.0-0034260884
Other Identifier: 991014878044704721

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Web of Science research areas: Engineering, Electrical & Electronic; Physics, Applied