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Data from: Strain-induced lead-free morphotropic phase boundary
Dataset   Open access

Data from: Strain-induced lead-free morphotropic phase boundary

Reza Ghanbari, Harikrishnan K. P., Kinnary Patel, Hua Zhou, Tao Zhou, Rui Liu, Liyan Wu, Aarushi Khandelwal, Kevin Crust, Sankalpa Hazra, …
24 Jul 2025
DOI: https://doi.org/10.5061/dryad.5dv41nsjf
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https://doi.org/10.5061/dryad.5dv41nsjfView
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Abstract

Dielectrics FOS: Engineering and technology Capacitors Thin Films
This dataset contains raw and processed experimental data supporting the study “Strain-induced lead-free morphotropic phase boundary.” Data were collected from NaNbO₃ thin films of varying thicknesses using techniques such as reciprocal space mapping (RSM), high-resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), piezoresponse force microscopy (PFM), scanning transmission electron microscopy (STEM), X-ray photoelectron spectroscopy (XPS), dielectric spectroscopy, and ferroelectric measurements. Files are organized by sample ID, with filenames indicating technique, sample thickness, date, and format. Data formats include .csv for tabular values, .ibw for Igor Pro binary waveforms, .pvsm and .vti for ParaView visualization states, .xrdml for XRD raw data, and image formats (.png, .PNG). These files can be reused to replicate the analyses presented in the associated article, enable independent phase and domain structure studies, and support the development of phase boundary engineering strategies in lead-free ferroelectric thin films. The dataset is released under the Creative Commons Zero (CC0) license and contains no personal or sensitive information.

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