Dissertation
Probing polar fluctuations in epitaxial ferroelectrics using inelastic light scattering
Doctor of Philosophy (Ph.D.), Drexel University
Jun 2023
DOI:
https://doi.org/10.17918/00001774
Abstract
Observing polar fluctuation dynamics in ferroelectric materials grants insight into the polarization energy landscape, informing us of a ferroelectric material's properties and behaviors with regards to temperature and strain. Inelastic light scattering is a non-destructive sample measuring technique sensitive to such fluctuations. A theory of light scattering is established to develop the shape of a special light scattering spectral signature called the Central Peak using the Fluctuation-Dissipation Theory. Monte Carlo "2D BaTiO₃" is modelled and power spectral densities are calculated to observe qualitative spectral properties of the Central Peak. Inelastic light scattering measurements are performed on both bulk and epitaxial thin film BaTiO₃, observing the temperature evolution of the Central Peak across phase transitions. Observations indicate that thin film Central Peak behavior differs considerably from the bulk, with signatures indicating that polar activity during phase transitions in thin films is frustrated by the presence of domain walls/thin film confinement effects.
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Details
- Title
- Probing polar fluctuations in epitaxial ferroelectrics using inelastic light scattering
- Creators
- Anthony Joseph Ruffino
- Contributors
- Jonathan E. Spanier (Advisor)
- Awarding Institution
- Drexel University
- Degree Awarded
- Doctor of Philosophy (Ph.D.)
- Publisher
- Drexel University; Philadelphia, Pennsylvania
- Number of pages
- viii, 72 pages
- Resource Type
- Dissertation
- Language
- English
- Academic Unit
- College of Arts and Sciences; Physics; Drexel University
- Other Identifier
- 991021212414404721