Application of rate process theory to the physics of failure of electronic components

Thesis

Robert L. Bergey

Master of Science (M.S.), Drexel Institute of Technology

1965

DOI:

https://doi.org/10.17918/00005679

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Electronics

Reliability (Engineering)

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Title: Application of rate process theory to the physics of failure of electronic components
Creators: Robert L. Bergey
Awarding Institution: Drexel Institute of Technology
Degree Awarded: Master of Science (M.S.)
Publisher: Drexel Institute of Technology; Philadelphia, Pennsylvania
Number of pages: 42, [1] page
Resource Type: Thesis
Language: English
Academic Unit: Drexel Institute of Technology (1936-1970)
Other Identifier: 991021887636604721