Effects of environmental stress application on silicon and germanium glass-encased diodes

Thesis

Samuel J. Keene Jr.

Master of Science (M.S.), Drexel Institute of Technology

1966

DOI:

https://doi.org/10.17918/00003878

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Germanium diodes

Semiconductors--Reliability

Silicon diodes

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Title: Effects of environmental stress application on silicon and germanium glass-encased diodes
Creators: Samuel J. Keene Jr.
Awarding Institution: Drexel Institute of Technology
Degree Awarded: Master of Science (M.S.)
Publisher: Drexel Institute of Technology; Philadelphia, Pennsylvania
Number of pages: 69 pages
Resource Type: Thesis
Language: English
Academic Unit: Drexel Institute of Technology (1936-1970)
Other Identifier: 991021888107804721