Fabrication testing and analysis of intermediate temperature heterojunction metal semiconductor GaAs photodetector

Thesis

Open access

James A. Culp

Master of Science (M.S.), Drexel University

1998

DOI:

https://doi.org/10.17918/00009632

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Title: Fabrication testing and analysis of intermediate temperature heterojunction metal semiconductor GaAs photodetector
Creators: James A. Culp
Awarding Institution: Drexel University
Degree Awarded: Master of Science (M.S.)
Publisher: Drexel University; Philadelphia, Pennsylvania
Number of pages: x, 80 pages
Resource Type: Thesis
Language: English
Academic Unit: Drexel University
Other Identifier: 991021888731504721