Measurement of backscattered electrons in an electron probe microanalyzer

Thesis

Philip G. Burkhalter

Master of Science (M.S.), Drexel Institute of Technology

1965

DOI:

https://doi.org/10.17918/00006475

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Electron microscopes

Electrons--Scattering

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Title: Measurement of backscattered electrons in an electron probe microanalyzer
Creators: Philip G. Burkhalter
Awarding Institution: Drexel Institute of Technology
Degree Awarded: Master of Science (M.S.)
Publisher: Drexel Institute of Technology; Philadelphia, Pennsylvania
Number of pages: 41, [1] page
Resource Type: Thesis
Language: English
Academic Unit: Drexel Institute of Technology (1936-1970)
Other Identifier: 991021887534704721