The fabrication verification and minority carrier lifetime measurement of high power gate turn-off thyristors

Thesis

Open access

Mark D. Allemang

Master of Science (M.S.), Drexel University

1990

DOI:

https://doi.org/10.17918/00007481

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Title: The fabrication verification and minority carrier lifetime measurement of high power gate turn-off thyristors
Creators: Mark D. Allemang
Awarding Institution: Drexel University
Degree Awarded: Master of Science (M.S.)
Publisher: Drexel University; Philadelphia, Pennsylvania
Number of pages: ix, 106 pages
Resource Type: Thesis
Language: English
Academic Unit: Drexel University
Other Identifier: 991021888721404721