Logo image
A Bootstrap Based Neyman-Pearson Test for Identifying Variable Importance
Journal article   Open access

A Bootstrap Based Neyman-Pearson Test for Identifying Variable Importance

Gregory Ditzler, Robi Polikar and Gail Rosen
IEEE transaction on neural networks and learning systems, v 26(4), pp 880-886
01 Apr 2015
PMID: 25794384
url
https://doi.org/10.1109/tnnls.2014.2320415View
Accepted (AM)Open Access (Publisher-Specific) Open

Abstract

Computer Science Computer Science, Artificial Intelligence Computer Science, Hardware & Architecture Computer Science, Theory & Methods Engineering Engineering, Electrical & Electronic Science & Technology Technology
Selection of most informative features that leads to a small loss on future data are arguably one of the most important steps in classification, data analysis and model selection. Several feature selection (FS) algorithms are available; however, due to noise present in any data set, FS algorithms are typically accompanied by an appropriate cross-validation scheme. In this brief, we propose a statistical hypothesis test derived from the Neyman-Pearson lemma for determining if a feature is statistically relevant. The proposed approach can be applied as a wrapper to any FS algorithm, regardless of the FS criteria used by that algorithm, to determine whether a feature belongs in the relevant set. Perhaps more importantly, this procedure efficiently determines the number of relevant features given an initial starting point. We provide freely available software implementations of the proposed methodology.

Metrics

8 Record Views
24 citations in Scopus

Details

UN Sustainable Development Goals (SDGs)

This publication has contributed to the advancement of the following goals:

#3 Good Health and Well-Being

InCites Highlights

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types
Domestic collaboration
Web of Science research areas
Computer Science, Artificial Intelligence
Computer Science, Hardware & Architecture
Computer Science, Theory & Methods
Engineering, Electrical & Electronic
Logo image