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Journal article
A Comparative Study of Residual Stresses and Microstructure in a-tC Films
MRS proceedings, v 383, pp 459-464
1995
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Abstract
We compare the microstructure of highly tetrahedrally-coordinated-amorphous carbon (atC) films prepared by pulsed laser deposition (PLD), measured using both small angle x-ray scattering (SAXS) and x-ray reflectivity, with other physical properties such as film stress and electrical resistivity. These properties are controlled by the film growth conditions and film thicknesses. Films prepared under vacuum conditions exhibit a shift in the measured mass density, as a function of laser energy density. The density for films approximately 600Å thick approach that of crystalline diamond. The measured densities for thicker, approximately 1000Å films, exhibit a smaller shift, and a lower density value. This shift correlates to observed changes in film stress and electrical resistivity. The small angle signal of the reflectivity spectra suggests the presence of layering, or in-plane density variations or a combination of both within the films.
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Details
- Title
- A Comparative Study of Residual Stresses and Microstructure in a-tC Films
- Creators
- L. J. Martínez-Miranda - University of Maryland, Dept. of Materials and Nuclear Engineering, College Park, MD 20742J. P. Sullivan - Sandia National LaboratoriesT. A. Friedmann - Sandia National LaboratoriesM. P. Siegal - Sandia National LaboratoriesT. W. Mercer - Drexel UniversityN. J. Dinardo - Drexel University
- Publication Details
- MRS proceedings, v 383, pp 459-464
- Publisher
- Cambridge University Press
- Number of pages
- 6
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Physics
- Web of Science ID
- WOS:A1995BE33L00048
- Other Identifier
- 991021862244104721
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Materials Science, Coatings & Films
- Materials Science, Multidisciplinary