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A method for characterizing mechanical properties of sugar films using a piezoelectric-excited millimeter sized cantilever (PEMC) sensor
Journal article   Peer reviewed

A method for characterizing mechanical properties of sugar films using a piezoelectric-excited millimeter sized cantilever (PEMC) sensor

Ramji S. Lakshmanan and Raj Mutharasan
Sensors and actuators. B, Chemical, v 160(1), pp 1304-1308
15 Dec 2011

Abstract

Chemistry Chemistry, Analytical Electrochemistry Instruments & Instrumentation Physical Sciences Science & Technology Technology
Resonant-mode cantilevers have been investigated widely for detection of target analyte mass. We examine its application for measuring mechanical property of an organic film. A cantilever resonant frequency depends both on its mass and its spring constant. A change in either one of them causes resonant frequency shifts. Piezoelectric excited millimeter sized cantilever (PEMC) sensors exhibit high mass-change sensitivity (2 fg/Hz) at high-order resonant modes present in the frequency range of 800-1000 kHz. The response of this high-order mode to the formation of a sugar film membrane provides experimental data for characterizing the mechanical properties of the sugar film. Sugar film formation, surprisingly, caused a significant resonant frequency increase of greater than 20 kHz. The high-order mode was highly sensitive to spring constant changes caused by the sugar film and was characterized by varying thickness and temperature of the sugar films. (C) 2011 Elsevier B.V. All rights reserved.

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Chemistry, Analytical
Electrochemistry
Instruments & Instrumentation
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