Journal article
A novel experimental technique for determining node location in resonant mode cantilevers
Journal of micromechanics and microengineering, v 21(6), p065027
01 Jun 2011
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
We report on a new technique for measuring transverse mode node locations in cantilever sensors using a simple experimental arrangement. The technique relies on measuring resonant frequency response as liquid immersion depth is varied at a constant rate. When the air-liquid interface traverses a node, resonant frequency change decreases considerably and is discernable by a simple correlation analysis. The accuracy of the approach is verified using uniform cross-section cantilevers, whose node locations of the first three modes were measured and the values were within 5.1% of theory. For further testing of the technique, node locations of non-uniform cross-section cantilevers were measured, and the results compared favorably with three-dimensional (3D) finite element models were within 6.6%.
Metrics
Details
- Title
- A novel experimental technique for determining node location in resonant mode cantilevers
- Creators
- Blake N. Johnson - Drexel Univ, Dept Chem & Biol Engn, Philadelphia, PA 19104 USARaj Mutharasan - Drexel Univ, Dept Chem & Biol Engn, Philadelphia, PA 19104 USA
- Publication Details
- Journal of micromechanics and microengineering, v 21(6), p065027
- Publisher
- Iop Publishing Ltd
- Number of pages
- 7
- Grant note
- CBET-0828987 / National Science Foundation; National Science Foundation (NSF)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Chemical and Biological Engineering
- Web of Science ID
- WOS:000291021900027
- Scopus ID
- 2-s2.0-79957960271
- Other Identifier
- 991019170972604721
UN Sustainable Development Goals (SDGs)
This publication has contributed to the advancement of the following goals:
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Engineering, Electrical & Electronic
- Instruments & Instrumentation
- Nanoscience & Nanotechnology
- Physics, Applied