Journal article
Affine-invariant B-spline moments for curve matching
IEEE transactions on image processing, v 5(10), pp 1473-1480
1996
PMID: 18290064
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
The article deals with the problem of matching and recognizing planar curves that are modeled by B-splines, independently of possible affine transformations to which the original curve has been subjected (for example, rotation, translation, scaling, orthographic, and semiperspective projections), and possible occlusion. It presents a fast algorithm for estimating the B-spline control points that is robust to nonuniform sampling, noise, and local deformations. Curve matching is achieved by using a similarity measure based on the B-spline knot points introduced by Cohen et al. (1991). This method, however, can neither handle the affine transformation between the curves nor the occlusion. Solutions to these two problems are presented through the use of a new class of weighted B-spline curve moments that are well defined for both open and closed curves. The method has been applied to classifying affine-transformed aircraft silhouettes, and appears to perform well.
Metrics
Details
- Title
- Affine-invariant B-spline moments for curve matching
- Creators
- Z Huang - United Technol. Res. Center, East Hartford, CT, USAF S Cohen
- Publication Details
- IEEE transactions on image processing, v 5(10), pp 1473-1480
- Publisher
- The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Web of Science ID
- WOS:A1996VL51300008
- Scopus ID
- 2-s2.0-0030269660
- Other Identifier
- 991019168592004721
UN Sustainable Development Goals (SDGs)
This publication has contributed to the advancement of the following goals:
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Collaboration types
- Industry collaboration
- Domestic collaboration
- Web of Science research areas
- Computer Science, Artificial Intelligence
- Engineering, Electrical & Electronic