- Title
- Atomic Defects and Edge Structure in Single-layer Ti3C2Tx MXene
- Creators
- Xiahan Sang - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USADundar Yilmaz - Department of Mechanical and Nuclear Engineering, The Pennsylvania State University, University Park, PA, USAYu Xie - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAMohamed Alhabeb - Department of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute, Drexel University, Philadelphia, PA 19104, USABabak Anasori - Department of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute, Drexel University, Philadelphia, PA 19104, USAXufan Li - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAKai Xiao - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAPaul R.C Kent - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAAdri van Duin - Department of Mechanical and Nuclear Engineering, The Pennsylvania State University, University Park, PA, USAYury Gogotsi - Department of Materials Science and Engineering, and A. J. Drexel Nanomaterials Institute, Drexel University, Philadelphia, PA 19104, USARaymond R Unocic - Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
- Publication Details
- Microscopy and microanalysis, v 23(S1), pp 1704-1705
- Publisher
- Cambridge University Press; New York, USA
- Number of pages
- 2
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Other Identifier
- 991014970039204721
Journal article
Atomic Defects and Edge Structure in Single-layer Ti3C2Tx MXene
Microscopy and microanalysis, v 23(S1), pp 1704-1705
Jul 2017
Abstract
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