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Atomic Defects in Monolayer Titanium Carbide (Ti3C2T x ) MXene
Journal article   Open access   Peer reviewed

Atomic Defects in Monolayer Titanium Carbide (Ti3C2T x ) MXene

Xiahan Sang, Yu Xie, Ming-Wei Lin, Mohamed Alhabeb, Katherine L Van Aken, Yury Gogotsi, Paul R. C Kent, Kai Xiao and Raymond R Unocic
ACS nano, v 10(10), pp 9193-9200
25 Oct 2016
PMID: 27598326
url
https://doi.org/10.1021/acsnano.6b05240View
Published, Version of Record (VoR) Open

Abstract

minimally intensive layer delamination (MILD) defect conductivity vacancy MXene ESI Highly Cited Paper (Incites)
The 2D transition metal carbides or nitrides, or MXenes, are emerging as a group of materials showing great promise in lithium ion batteries and supercapacitors. Until now, characterization and properties of single-layer MXenes have been scarcely reported. Here, using scanning transmission electron microscopy, we determined the atomic structure of freestanding monolayer Ti3C2T x flakes prepared via the minimally intensive layer delamination method and characterized different point defects that are prevalent in the monolayer flakes. We determine that the Ti vacancy concentration can be controlled by the etchant concentration during preparation. Density function theory-based calculations confirm the defect structures and predict that the defects can influence the surface morphology and termination groups, but do not strongly influence the metallic conductivity. Using devices fabricated from single- and few-layer Ti3C2T x MXene flakes, the effect of the number of layers in the flake on conductivity has been demonstrated.

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Highly Cited Paper 
Collaboration types
Domestic collaboration
Web of Science research areas
Chemistry, Multidisciplinary
Chemistry, Physical
Materials Science, Multidisciplinary
Nanoscience & Nanotechnology
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