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Atomic-Scale Characterization of Oxide Thin Films Gated by Ionic Liquid
Journal article   Peer reviewed

Atomic-Scale Characterization of Oxide Thin Films Gated by Ionic Liquid

Andrew C. Lang, Jennifer D. Sloppy, Hessam Ghassemi, Robert C. Devlin, Rebecca J. Sichel-Tissot, Juan-Carlos Idrobo, Steven J. May, Mitra L. Taheri and Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
ACS applied materials & interfaces, Vol.6(19), pp.17018-17023
08 Oct 2014
PMID: 25188384

Abstract

Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Science & Technology Science & Technology - Other Topics Technology

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Materials Science, Multidisciplinary
Nanoscience & Nanotechnology