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Big, Deep, and Smart Data in Scanning Probe Microscopy
Journal article   Open access   Peer reviewed

Big, Deep, and Smart Data in Scanning Probe Microscopy

Sergei V. Kalinin, Evgheni Strelcov, Alex Belianinov, Suhas Somnath, Rama K. Vasudevan, Eric J. Lingerfelt, Richard K. Archibald, Chaomei Chen, Roger Proksch, Nouamane Laanait, …
ACS nano, v 10(10), pp 9068-9086
01 Oct 2016
PMID: 27676453
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Abstract

Chemistry Chemistry, Multidisciplinary Chemistry, Physical Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Science & Technology Science & Technology - Other Topics Technology
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining,, visual analytics, and knowledge discovery technologies.

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Collaboration types
Domestic collaboration
Web of Science research areas
Chemistry, Multidisciplinary
Chemistry, Physical
Materials Science, Multidisciplinary
Nanoscience & Nanotechnology
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