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Characteristics of THz waves and carrier scattering in boron-doped epitaxial Si and Si1-xGex films
Journal article   Peer reviewed

Characteristics of THz waves and carrier scattering in boron-doped epitaxial Si and Si1-xGex films

S K Ray, T N Adam, R T Troeger, J Kolodzey, G Looney and A Rosen
Journal of applied physics, v 95(10), pp 5301-5304
15 May 2004

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

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14 citations in Scopus

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#9 Industry, Innovation and Infrastructure

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Collaboration types
Industry collaboration
Domestic collaboration
International collaboration
Web of Science research areas
Physics, Applied
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