Published, Version of Record (VoR)Open Access Discount via Drexel Libraries Read and Publish Program 2025CC BY V4.0, Open
Abstract
characterization phosphorus allotropes Raman X-ray diffraction Electron Microscopy
Recent advancements in carbon nanotubes and graphene have driven significant research into other low-dimensional materials, with phosphorus-based materials emerging as a notable area of interest. Phosphorus nanowires and thin sheets show promise for applications in devices such as batteries, photodetectors, and field-effect transistors. However, the presence of multiple allotropes of phosphorus complicates their characterization. Accurate identification of these allotropes is essential for understanding their physical, optical, and electronic properties, which influence their potential applications. Researchers frequently encounter difficulties in consolidating literature for the confirmation of the structure of their materials, a process that can be time-consuming. This minireview addresses this issue by providing a comprehensive, side-by-side comparison of Raman and X-ray diffraction characteristic peaks, as well as electron microscopic images and lattice spacings, for the various phosphorus allotropes. To our knowledge, this is the first compilation to integrate all major structural fingerprints into unified summary tables, enabling rapid cross-referencing. This resource aims to support researchers in accurately identifying phosphorus phases during synthesis and device fabrication workflows. For example, distinguishing between red phosphorus polymorphs is crucial for optimizing anode materials in sodium-ion batteries, where electrochemical performance is phase-dependent.