Journal article
Characterization of Interphase Regions Using Atomic Force Microscopy
MRS proceedings, v 458
1996
Abstract
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date, diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.
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Details
- Title
- Characterization of Interphase Regions Using Atomic Force Microscopy
- Creators
- M. R. Vanlandingham - University of DelawareS. H. McKnight - United States Army Research LaboratoryG. R. Palmese - University of DelawareT. A. Bogetti - United States Army Research LaboratoryR. F. Eduljee - University of DelawareJ. W. Gillespie - University of Delaware
- Contributors
- C.L. Briant (Editor)C.B. Carter (Editor)E.L. Hall (Editor)
- Publication Details
- MRS proceedings, v 458
- Publisher
- Cambridge University Press
- Number of pages
- 6
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Chemical and Biological Engineering
- Other Identifier
- 991019201505304721