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Journal article
Characterization of highly conducting, ultra-thin polyaniline films produced by evaporative deposition
Chemical physics letters, v 263(1)
1996
Abstract
The chemical and electronic properties of ultra-thin polyaniline films produced by the evaporative deposition of emeraldine was studied using high resolution electron energy loss spectroscopy (HREELS). Vapor-deposited polyaniline films were found to consist of relatively short chains and exist in an oxidation state close to that of the starting emeraldine powder. Films doped with HCl exhibited a plasma frequency in the far-IR at low temperature. This indicates that ultra-thin, vapor-deposited emeraldine films are highly crystalline and, when doped with HCl, exhibit conductivities several orders of magnitude higher than those of HCl-doped emeraldine films produced by wet-chemical deposition techniques. The results of this study suggest that evaporative deposition may be an attractive fabrication technique for the production of polyaniline thin films for future applications in microelectronics.
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Details
- Title
- Characterization of highly conducting, ultra-thin polyaniline films produced by evaporative deposition
- Creators
- R.V. Plank - University of PennsylvaniaY. Wei - Drexel UniversityN.J. DiNardo - Drexel UniversityJ.M. Vohs - University of Pennsylvania
- Publication Details
- Chemical physics letters, v 263(1)
- Publisher
- Elsevier
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Physics
- Web of Science ID
- WOS:A1996VW24400006
- Scopus ID
- 2-s2.0-0030573137
- Other Identifier
- 991019167762304721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Chemistry, Physical
- Physics, Atomic, Molecular & Chemical