Charge Storage Mechanism in Sub-Nanometer Pores and its Consequence for Electrical Double Layer Capacitors

Journal article

Open access

Patrice Simon, Celine Largeot, John Chmiola, Rongying Lin, Pierre-Louis Taberna and Yury Gogotsi

Meeting abstracts (Electrochemical Society), v MA2008-02(5), pp 498-498

29 Aug 2008

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https://doi.org/10.1149/ma2008-02/5/498View

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https://doi.org/10.1149/MA2008-02/5/498View

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Title: Charge Storage Mechanism in Sub-Nanometer Pores and its Consequence for Electrical Double Layer Capacitors
Creators: Patrice Simon
Celine Largeot
John Chmiola
Rongying Lin
Pierre-Louis Taberna
Yury Gogotsi
Publication Details: Meeting abstracts (Electrochemical Society), v MA2008-02(5), pp 498-498
Publisher: Institute of Physics (IOP)
Resource Type: Journal article
Language: English
Academic Unit: Materials Science and Engineering
Other Identifier: 991019186797904721