Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

$Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction$

Journal article

Peer reviewed

It Meng Low, M.W. Barsoum, M. Singh, P. Manurung, E. Wren and D.P. Sheppard

Key engineering materials, v 224-226, pp 505-510

18 Jun 2002

Additional Links

Synchrotron Radiation Diffraction

Grazing Incidence

Layered-Graded

Depth Profiling

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Title: Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
Creators: It Meng Low - Curtin University
M.W. Barsoum - :
M. Singh - Curtin University
P. Manurung - :
E. Wren - :
D.P. Sheppard - :
Publication Details: Key engineering materials, v 224-226, pp 505-510
Publisher: Trans Tech Publications Ltd
Resource Type: Journal article
Language: English
Academic Unit: Materials Science and Engineering
Web of Science ID: WOS:000176367400109
Other Identifier: 991019167740104721

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types: Domestic collaboration; International collaboration
Web of Science research areas: Materials Science, Ceramics; Materials Science, Composites