Journal article
Design of self-diagnostic boards by signature analysis
IEEE transactions on industrial electronics (1982), v 36(2), pp 241-245
01 May 1989
Abstract
The authors present a single-faulty-chip diagnostic technique which requires only two reference signatures for any number of chips on the original board. With this technique, it is possible to reduce substantially the hardware overhead compared to the diagnostic technique based on separate testing of each chip on the board. The technique can be also used for identification of faulty printed boards in a system or for identification of faulty processors in a multiprocessor system.< >
Metrics
Details
- Title
- Design of self-diagnostic boards by signature analysis
- Creators
- M.G. Karpovsky - Boston UniversityP. Nagvajara - Boston University
- Publication Details
- IEEE transactions on industrial electronics (1982), v 36(2), pp 241-245
- Publisher
- IEEE
- Number of pages
- 5
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Web of Science ID
- WOS:A1989U353800017
- Scopus ID
- 2-s2.0-0024666184
- Other Identifier
- 991021945112404721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Automation & Control Systems
- Engineering, Electrical & Electronic
- Instruments & Instrumentation